1 /* SPDX-License-Identifier: BSD-2-Clause */
2 /*
3  * Copyright (c) 2014, STMicroelectronics International N.V.
4  */
5 #ifndef CORE_PTA_TESTS_MISC_H
6 #define CORE_PTA_TESTS_MISC_H
7 
8 #include <compiler.h>
9 #include <tee_api_types.h>
10 #include <tee_api_defines.h>
11 
12 /* basic run-time tests */
13 TEE_Result core_self_tests(uint32_t nParamTypes,
14 			   TEE_Param pParams[TEE_NUM_PARAMS]);
15 
16 TEE_Result core_fs_htree_tests(uint32_t nParamTypes,
17 			       TEE_Param pParams[TEE_NUM_PARAMS]);
18 
19 TEE_Result core_mutex_tests(uint32_t nParamTypes,
20 			    TEE_Param pParams[TEE_NUM_PARAMS]);
21 
22 #ifdef CFG_LOCKDEP
23 TEE_Result core_lockdep_tests(uint32_t nParamTypes,
24 			      TEE_Param pParams[TEE_NUM_PARAMS]);
25 #else
core_lockdep_tests(uint32_t nParamTypes __unused,TEE_Param pParams[TEE_NUM_PARAMS]__unused)26 static inline TEE_Result core_lockdep_tests(
27 		uint32_t nParamTypes __unused,
28 		TEE_Param pParams[TEE_NUM_PARAMS] __unused)
29 {
30 	return TEE_ERROR_NOT_SUPPORTED;
31 }
32 #endif
33 
34 TEE_Result core_aes_perf_tests(uint32_t param_types,
35 			       TEE_Param params[TEE_NUM_PARAMS]);
36 
37 #endif /*CORE_PTA_TESTS_MISC_H*/
38